| Model | TH2840AX | TH2840BX | TH2840NX |
| Display | Display | 10.1" Captive Touch Screen |
| Ratio | 16:09 |
| Resolution | 1280RGB800 |
| Test PIN | 20PIN(By TH1806) | 48PIN(Can extend to 288PIN) |
| Frequency | Range | 20Hz-500kHz | 20Hz-2MHz | 20Hz-500kHz |
| Accuracy | 0.01% |
| Resolution | 0.1mHz (20.0000Hz-99.9999Hz) |
| 1mHz (100.000Hz-999.999Hz) |
| 10mHz (1.00000kHz-9.99999kHz) |
| 100mHz (10.0000kHz-99.9999kHz) |
| 1Hz (100.000kHz-999.999kHz ) |
| 10Hz (1.00000MHz-2.00000MHz) |
| AC test signal mode | Rated value (ALC OFF) | Set the voltage as the Hcur voltage when the test terminal is open |
| Set the current to be the current flowing from Hcur when the test terminal is short-circuited |
| Constant value (ALC ON) | Keep the voltage on the DUT the same as the set value |
| Keep the current on the DUT the same as the set value |
| Test Level | AC Voltage | 5mVrms-20Vrms | F<=1MHz 5mVrms-20Vrms | 5mVrms-20Vrms |
| F>1MHz 5mVrms-15Vrms |
| Accuracy | (10%the set value+2mV)(AC<=2Vrms) |
| (10%the set value+5mV)(AC2Vrms) |
| Resolution | 1mVrms (5mVrms-0.2Vrms) |
| 1mVrms (0.2Vrms-0.5Vrms) |
| 1mVrms (0.5Vrms-1Vrms) |
| 10mVrms (1Vrms-2Vrms) |
| 10mVrms (2Vrms-5Vrms) |
| 10mVrms (5Vrms-10Vrms) |
| 10mVrms (10Vrms-20Vrms) |
| AC Current | 50Arms-100mArms |
Resolution(100 Internal
Resistance) | 10Arms (50Arms-2mArms) |
| 10Arms (2mArms-5mArms) |
| 10Arms (5mArms-10mArms) |
| 100Arms (10mArms-20mArms) |
| 100Arms (20mArms-50mArms) |
| 100Arms (50mArms-100mArms) |
| RDC Test | Voltage | 100mV-20V |
| Resolution | 1mV (0V-1V) |
| 10mV (1V-20V) |
| Current | 0mA-100mA |
| Resolution | 10A (0mA-10mA) |
| 100A (10mA-100mA) |
| DC Bias * | Voltage | 0V-40V |
| Accuracy | AC<=2V 1%the set voltage+5mV |
| AC>2V 2%the set voltage+8mV |
| Resolution | 1mV (0V - 1V) |
| 10mV (1V - 40V) |
| Current | 0mA-100mA |
| Resolution | 10A (0mA-10mA) |
| 100A (10mA-100mA) |
| Built-in current source | Current | 0mA-2A |
| Accuracy | I>5mA (2%the set value+2mA) |
| Resolution | 1mA |
| Output impedance | 30, 4%@1kHz |
| 100, 2%@1kHz |
| LCR Function |
| Test Parameter | Method | Arbitrary selection of four parameters |
| AC | Cp/Cs, Lp/Ls, Rp/Rs, |Z|, |Y|, R, X, G, B, , D, Q, VAC, IAC |
| DC | RDC, VDC, IDC |
| Test Terminal Configuration | Four Terminal Pair |
| Test Cable Length | 0m |
| Computation | The absolute deviation from the nominal value , the percentage deviation from the nominal value % |
| Equivalent Way | Series, Parallel |
| Calibration Function | OPEN, SHORT, LOAD |
| Average Times | 1-255 |
| Range Selection | AUTO, HOLD |
| Range Configuration | LCR | 100m, 1, 10, 20, 50, 100, 200, 500, 1k, 2k, 5k, 10k, 20k, 50k, 100k |
| RDC | 1, 10, 20, 50, 100, 200, 500, 1k, 2k, 5k, 10k, 20k, 50k, 100k |
| Test Speed (ms) | Fast+: 1ms. Fast: 3.3ms. Middle: 90ms. |
| Slow: 220ms |
| Highest accuracy | 0.05% Please refer to the manuals for the details |
| Measurement display range |
| Cs, Cp | 0.00001pF-9.99999F |
| Ls, Lp | 0.00001H-99.9999kH |
| D | 0.00001-9.99999 |
| Q | 0.00001-99999.9 |
| R, Rs, Rp, X, Z, RDC | 0.001m-99.9999M |
| G, B, Y | 0.00001s-99.9999S |
| VDC | 0V-999.999V |
| IDC | 0A-999.999A |
| r | -6.28318 |
| d | -179.999-179.999 |
| % | (0.000%-999.9%) |
| TurnsRatio | 10.00110001 |
| Transformer Test |
| Test Parameter | Cs/Cp, Ls/Lp, DCR, Zx, Rs/Rp, D, Q, dZ, , Lk, Phase, Balance
Turns-Ratio, Ns:Np=U2/U1, Np:Ns=U1/U2
Turns: Ns=NpU2/U1, Np=NsU1/U2 |
| Test Mode | Continous | In the single trigger mode, manually trigger once, and once test all the test parameters. |
| Step | In the single trigger mode, manually trigger once to measure one parameter. Trigger again to measure the next parameter. |
| Test Speed (ms) | Fast | Fast: 3.3ms, Fast+ 0.56ms(>10kHz) |
| Middle | Middle: 90ms |
| Slow | Slow: 220ms |
| Bias Resource | See * |
| Average Times | Each test parameter can set different average times, the average times is 0-255 |
| Time Delay | Each test parameter can set a different delay time |
| Transformer Scanning |
| Built in Scanning Board | No | One Board as standard. Could extend to six boards. ((242)PIN per board) |
| Transformer Handler | PIN Definition | NS1-NS30, GOOD, NG, TEST, TRIGGER, RESET | NS1-NS9, GOOD, NG, TEST, TRIGGER, RESET |
| Output characteristics | Optocoupler isolation, ULN2003 drive enhancement, collector output |
| Model | Direct reading, percentage |
| Test Range | Auto, Hold |
| Bias Resource | See * |
| External scanning box | compatible to TH1901 series, TH1831 scanning box, TH1806 series |
| Number of windings | Primary | 60 |
| Secondary | 9 |
| Average Times | Each test parameter can set different average times, the average times is 0-255 |
| Time Delay | Each test parameter can set a different delay time |
| Test Speed (ms) | Fast | Fast: 3.3ms(>=1kHz). Fast+ : 0.56ms(>=10kHz) (Exclude the time for the realy action) |
| Middle | Middle: 90ms |
| Slow | Slow: 220ms |
| Test lead interface | 25*2pin FRC socket |
| Other Functions and specifications |
| Storage | Internal | About 100M non-volatile memory test setting file |
| U Disk | Test setting file, screenshot graph, record file |
| Keyboard Lock | The front panel keys can be locked |
| Interface | USB HOST | 2 USB HOST ports. Mouse and keyboard could work at the same time. Only one U disk can be used at the same time. |
| USB DEVICE | Universal serial bus socket, small type B (4 contact positions); compatible with USB TMC-USB488 and USB2.0, the female connector is used to connect an external controller. |
| LAN | 10/100M Ethernet adaptive, 8 Pin |
| HANDLER | Used for Bin signal output |
| External DC BIAS Control | Support TH1778A (do not support transformer scanning) |
| RS232C | Standard 9-pin, cross |
| RS485 | Can accept modification or connect to RS232 to RS485 adaptor |
| Power-on Warm-up Time | 60 Minutes |
| Output Voltage | 100-120VAC/198-242VAC Optional, 47-63Hz |
| Power Consumption | More than 130VA |
| Size (WxHxD) mm | 430mm(W)x177mm(H)x265mm(D) | 430mm(W)x177mm(H)x405mm(D) |
| Weight (kg) | 11kg | 17kg |
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